Ok I have compiled some information I hope will help me get a better understanding of the self test results.

Well to start with on the self test results page you are presented with 8 bytes that indicate individual test results like this:

x1111 00000 00000 10000	00111 00101
01010 10101 00111 10000	00110 00xxx
00000000 00000000 00000000 00001100
00000000 00000000 00000000 00000000 

The first byte indicates the test results for 00-04 as in:


       	x1111

	^^^^^
	
test  	00000
number 	01234

A number 1 indicates a fail and a 0 indicates a pass. X also appears to indicate a fail.

The last remaining 2 rows of numbers elude me at the moment.

Each test can be run individually by pressing the ignore button at the 
results screen and select "system" (F4) then "etc" (etc) then "debug" (f1)

From this screen press "run" then type the test number and press enter

Results at faulty boot (Without pod plugged in):

test   00000 00000 11111 11111 22222 22222
number 01234 56789 01234 56789 01234 56789
------ ----- ----- ----- ----- ----- ----- 
Result x1111 00000 00000 10000 00101 00101

test   33333 33333 44444 44444 55555 55555
number 01234 56789 01234 56789 01234 56789
------ ----- ----- ----- ----- ----- ----- 
Result 01010 10101 00111 10000 00110 00xxx

Failed:	Information
-------	---------------------
0	:Clip test		:Failed 00001111 11111111 11111111 11110000
1	:?			:Failed 00000000 00000000 00000000 00000001
2	:?			:Failed 00000000 00000000 00000000 00000001
3	:?			:Failed 00000000 00000000 00000000 00000001
4	:?			:Failed 00000000 00000000 00000000 00000001
15	:?			:Failed 00000000 00000000 00000000 00000001
22	:?			:Failed 00000000 00000000 00000000 00000001
24	:?			:Failed 00000000 00000000 00000000 00000001
27	:?			:Failed 00000000 00000000 00000000 00000001
29	:?			:Failed 00000000 00000000 00000000 00000001

					00000000 00000000 00000000 00001000
					00000000 00000000 00000000 00000000
31	:			:Failed 00000000 00000000 00000000 00000001

					00000000 00000000 00000000 00001000
					00000000 00000000 00000000 00000000
33	:			:Failed 00000000 00000000 00000000 00000001

					00000000 00000000 00000000 00001000
					00000000 00000000 00000000 00000000
35	:			:Failed 00000000 00000000 00000000 00000001

					00000000 00000000 00000000 00001000
					00000000 00000000 00000000 00000000
37	:			:Failed 00000000 00000000 00000000 00000001

					00000000 00000000 00000000 00001000
					00000000 00000000 00000000 00000000
39	:			:Failed 00000000 00000000 00000000 00000001

					00000000 00000000 00000000 00001000
					00000000 00000000 00000000 00000000
43	:			:Failed 00001111 11111111 11111111 11111111
47	:Hardware test		:Failed 00000000 00000000 00000000 00000001

					00000000 00000000 00000000 00001000
					00000000 00000000 00000000 00000000
50	:			:Passed (Does x mean doesn't matter?)
52	:			:Failed 01000000 00000000 00000000 00000001
53	:			:Failed 00000000 00000000 00000000 00000001
57	:Test invalid
58	:Test invalid
59	:Test invalid


Results with 180Ohm resistor on pins 12-14,11-14:

Fault	00000	00000	11111	11111	22222	22222
number	01234	56789	01234	56789	01234	56789

Result	x1111	00000	00000	10000	00111	00101
Result	01010	10101	00111	10x00	x0110	00xxx

Fault	33333	33333	44444	44444	55555	55555
number	01234	56789	01234	56789	01234	56789



Another thing to note is that there is a clear warning on the interface buffer sockets which state that J1 and J2 should not be swapped as permanent damage will result. On inspection if these are swapped J1 will put -8v onto IC U8 (AM6687DL) pin 1. Pin 1 is the non inverted out of this high speed comparator which would likely damage it.